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XRD-Ninja
08-26-2008, 09:53 AM
High degrees of texture can make RS measurement more difficult due to anisotropy. The new topo-tomography technique seems to be a promising solution for this problem.
Using the filtered back-projection technique (used in medical CT) I am often able to create an image of the grain boundaries using the profiles collected for a standard sin^2 psi RS measurement.
By reconstructing the grain boundaries and the grain orientations the diffracted peaks can be broken down to their individual grain contributions (I am still working on this part) allowing for the calculation of intergranular (Type II) stress'. There seems to be a few ways to go about this. Does anyone have any experience with these techniques?

Robert
08-28-2008, 11:05 AM
XRD-Ninja do you have a link to a paper or info on this topic.

XRD-Ninja
09-02-2008, 06:46 PM
I have some papers at work but I have been blocked from the forum area so I can't find the links right now. It took me a while to dig up the appropriate information, I am getting the block removed. Here is a quick blurb on it:
http://xrm2005.spring8.or.jp/program2/InvitedOralAbstract/41.Wolfgang_Ludwig.pdf
Most information online is from synchrotron sources, but papers are emerging showing it is possible with weaker sources with higher scatter (xrd tubes). Wikipedia gives a good explanation of tomography and how the fourier transformation is applied. It is basically tomography of the orientation contrast distributions.
Another interesting approach for the same result is 3DXRD and is worth a look.